What microscopy instruments are available at the Texas A&M Microscopy and Imaging Center?

Updated

The Texas A&M Microscopy and Imaging Center (MIC) names four major instrument systems on its homepage: a Leica SP8 Confocal/STED/FLIM system, an FEI Quanta 600 field-emission scanning electron microscope (FE-SEM), a TFS Helios 5 CX DualBeam Cryo FIB-SEM, and a JEOL 1200 EX transmission electron microscope (TEM). The site presents these as highlights under a "More Instruments" link, so the homepage list is a starting point rather than a complete inventory. If you need a specific technique, check the center's instrument pages before planning a session.

The instruments named on the site

Instrument Type General use
Leica SP8 Confocal, STED, FLIM System Light microscope (confocal, super-resolution, lifetime imaging) Fluorescence imaging of cells and tissues; optical sectioning; imaging below the classical diffraction limit with STED; fluorescence lifetime measurements with FLIM
FEI Quanta 600 FE-SEM Scanning electron microscope Surface and near-surface imaging of bulk samples; topography and contrast at high resolution
TFS Helios 5 CX DualBeam Cryo FIB-SEM Dual-beam SEM with focused ion beam and cryo capability Site-specific milling and cross-sectioning with the ion beam while imaging with the electron beam; cryo workflows for beam-sensitive or hydrated specimens
JEOL 1200 EX TEM Transmission electron microscope Imaging of thin sections and grids; internal structure of cells and materials at the nanometer scale

What each type is generally used for

  • Confocal and super-resolution light microscopy is the usual choice when you need fluorescence signal from a labeled sample, optical sections through a thick specimen, or resolution beyond conventional light microscopy. STED adds super-resolution; FLIM adds lifetime-based contrast, which is useful when intensity alone is ambiguous.
  • SEM is for surface morphology of solid samples. It is the standard first look at particles, materials, and tissue surfaces, and it pairs well with elemental analysis if the instrument is so equipped.
  • DualBeam FIB-SEM combines imaging with precise material removal. The ion beam lets you cut into a specific location and then image the exposed face, which is useful for cross-sections, lamella preparation, and tomography. The cryo capability extends this to frozen-hydrated or beam-sensitive samples.
  • TEM is for transmission imaging of electron-transparent specimens. It reveals internal structure—organelles, membranes, nanoparticles—at higher resolution than SEM, but requires thin samples and more demanding preparation.

Practical points before you plan a session

  • The homepage list is not exhaustive. The "More Instruments" link implies additional systems beyond the four featured. Confirm the full inventory on the site's instrument pages.
  • Sample preparation matters as much as the instrument. The center's own SEM workshop description notes that presentations cover "basic sample preparation techniques," which signals that prep is part of the workflow you should plan for.
  • Training is a gate for new users. The MIC runs a free Scanning Electron Microscopy workshop for Texas A&M students and researchers new to SEM, scheduled November 3–4, 2026, in ILSB 1143 and online via Zoom. Hands-on sessions are limited to 5 registrants each. If you are new to electron microscopy, this is a low-cost way to get oriented before requesting instrument time.
  • Access is tied to Texas A&M participation for the free workshop. The site states the workshop is free for Texas A&M University participants; it does not state pricing or access terms for instrument use itself, so ask the center directly about scheduling and costs.

How to choose among them

Start from your sample and your question, not the instrument name:

  1. Is your signal fluorescent, and do you need optical sections? Go to the confocal/STED/FLIM system.
  2. Do you need surface topography of a solid sample? Start with SEM.
  3. Do you need to cut into a specific spot and image the cross-section, or work with frozen samples? The DualBeam Cryo FIB-SEM is the relevant tool.
  4. Do you need internal structure at nanometer resolution from a thin sample? That is TEM territory, and it will require the most preparation.

For full specifications, accessory details, and booking information, use the instrument pages linked from the MIC homepage rather than relying on the featured list alone.