microscopy.tamu.edu

The Texas A&M Microscopy and Imaging Center (MIC) is a core research facility that supports imaging work across basic and applied sciences, and its site (microscopy.tamu.edu) is organized around three practical entry points: instruments, events, and news. If you want to use the facility, register for training, or see what equipment is on hand, start from the main site navigation rather than searching for a separate contact page—the provided site material emphasizes instruments, a workshop registration link, and publication news, but does not include a dedicated contact or booking page.

What the MIC Is and Who It Serves

The MIC describes its mission as "promoting cutting edge research in basic and applied sciences through research and development activities." In practice, it is a shared imaging facility serving Texas A&M students and researchers, including those new to specific techniques. The site's news section notes that data acquired at the MIC is used in research "all over campus and beyond," and it links to articles citing use of the center—useful if you want to see how the facility has supported published work before you plan a project.

Instruments Listed on the Site

The main page names several systems, which is the fastest way to check whether the MIC has the capability you need:

The site labels this list "More Instruments," indicating additional systems exist beyond those named. If your work depends on a specific detector, cryo capability, or resolution target, confirm the exact configuration with the facility before scheduling—the main page gives instrument names, not detailed specifications.

Free Scanning Electron Microscopy Workshop

The site promotes a free SEM workshop aimed at students and researchers new to scanning electron microscopy. Key details from the event listing:

• Dates: November 3–4, 2026
• Times: 10:00 am–4:00 pm and 1:00 pm–4:00 pm
• Location: ILSB 1143 and virtual (Zoom)
• Cost: Free for Texas A&M University participants
• Content: Basic principles of SEM imaging, factors affecting resolution and contrast, and basic sample preparation techniques
• Hands-on sessions: Limited to 5 registrants each

To attend, use the "Register Here" link on the event listing. Because hands-on seats are capped at five per session, register early if you want practical time on the instrument; the presentations themselves are accessible both in person and online, so remote attendance is a viable option for the lecture portion.

Finding News, Publications, and Events

The site's "News Feed" section highlights research using MIC data, including a journal cover featuring TEM work and confocal imaging used in tick neuropeptide research. The "More Events" link leads to the fuller events calendar beyond the SEM workshop. These sections are the best places to check for additional training sessions, user achievements, and facility updates.

Practical Next Steps

1. Check capability first: Match your technique (confocal, SEM, cryo FIB-SEM, TEM) against the instrument list, then ask the facility about the specific configuration you need.
2. Register for training: If you are new to SEM, use the workshop registration link; note the five-person hands-on limit.
3. Plan around the workshop format: Attend the lectures in person at ILSB 1143 or via Zoom, and reserve hands-on time separately.
4. Look for access details on-site: The provided material does not include a contact form, phone number, or booking system, so use the main site's navigation and event pages to locate current access and contact information before your first visit.

Research conducted at the Texas A&M Microscopy and Imaging Center (MIC) is used in publications across campus and beyond. The center's site states that data acquired at the MIC is being used to further research all over campus and beyond, and it links to a running collection of articles that cite use of the MIC. If you are planning to publish work that relies on MIC instruments, the practical takeaway is to check that collection for examples of how other groups have credited the center, and to describe the specific instrument and center in your methods.

What the MIC says about publication use

The center frames its purpose as promoting cutting-edge research in basic and applied sciences through research and development activities. Its site treats publication use as evidence of that mission: a "News Feed" section and a dedicated page collect articles citing the MIC, and the site invites readers to "Read more of the articles citing use of the MIC here."

Two examples are highlighted on the site:

• Cover art in Macromolecular Materials and Engineering featuring the F20 Materials TEM.
• Confocal imaging used to fluorescently tag a tick kinin neuropeptide that triggers peristalsis and labels tick midgut muscles.

These examples show the range of outputs the center points to: instrument-specific imaging that appears in journal cover art, and biological imaging that supports findings in entomology and physiology.

Why this matters if you use MIC instruments

Publication records serve two purposes for prospective users. First, they show what the instruments have actually produced, which helps you judge whether a given tool fits your project. Second, they give you models for how to write up MIC-acquired data, including how the center and specific instruments are named.

The instruments named on the site include:

If your results come from one of these systems, naming the instrument and the center in your methods is the minimum the site's examples imply. The site does not publish a formal acknowledgment template, so treat the linked articles as your guide rather than a fixed wording.

How to find and use the citation list

1. Go to the MIC site and open the page or news section that collects articles citing the MIC (the site links it as "Read more of the articles citing use of the MIC here").
2. Scan for papers that used the same instrument class as your project — for example, confocal/FLIM work versus TEM or FIB-SEM work.
3. Note how those papers describe sample preparation, instrument settings, and the center itself.
4. Draft your methods and acknowledgments to match that level of detail, then confirm any center-specific requirements with MIC staff before submission.

The expected result is a methods section that identifies the MIC and the instrument precisely enough for readers to locate the facility, plus an acknowledgment consistent with how prior users have credited it.

Common sticking points

• No published template. The site points to example articles rather than a required acknowledgment sentence, so wording varies by paper. Check several examples rather than copying one.
• Instrument naming. The site lists full instrument names (for example, "TFS Helios 5 CX DualBeam CRYO FIB-SEM"). Using the full name avoids ambiguity about which system produced the data.
• Scope of the list. The citation collection is described as covering research "all over campus and beyond," so it is a sample of use, not a complete index of every MIC-supported paper.

For questions about how to credit the center in a specific manuscript, the most reliable step is to contact MIC staff directly; the site does not state a formal policy beyond linking to citing articles.

The Texas A&M Microscopy and Imaging Center (MIC) names four major instrument systems on its homepage: a Leica SP8 Confocal/STED/FLIM system, an FEI Quanta 600 field-emission scanning electron microscope (FE-SEM), a TFS Helios 5 CX DualBeam Cryo FIB-SEM, and a JEOL 1200 EX transmission electron microscope (TEM). The site presents these as highlights under a "More Instruments" link, so the homepage list is a starting point rather than a complete inventory. If you need a specific technique, check the center's instrument pages before planning a session.

The instruments named on the site

What each type is generally used for

• Confocal and super-resolution light microscopy is the usual choice when you need fluorescence signal from a labeled sample, optical sections through a thick specimen, or resolution beyond conventional light microscopy. STED adds super-resolution; FLIM adds lifetime-based contrast, which is useful when intensity alone is ambiguous.
• SEM is for surface morphology of solid samples. It is the standard first look at particles, materials, and tissue surfaces, and it pairs well with elemental analysis if the instrument is so equipped.
• DualBeam FIB-SEM combines imaging with precise material removal. The ion beam lets you cut into a specific location and then image the exposed face, which is useful for cross-sections, lamella preparation, and tomography. The cryo capability extends this to frozen-hydrated or beam-sensitive samples.
• TEM is for transmission imaging of electron-transparent specimens. It reveals internal structure—organelles, membranes, nanoparticles—at higher resolution than SEM, but requires thin samples and more demanding preparation.

Practical points before you plan a session

• The homepage list is not exhaustive. The "More Instruments" link implies additional systems beyond the four featured. Confirm the full inventory on the site's instrument pages.
• Sample preparation matters as much as the instrument. The center's own SEM workshop description notes that presentations cover "basic sample preparation techniques," which signals that prep is part of the workflow you should plan for.
• Training is a gate for new users. The MIC runs a free Scanning Electron Microscopy workshop for Texas A&M students and researchers new to SEM, scheduled November 3–4, 2026, in ILSB 1143 and online via Zoom. Hands-on sessions are limited to 5 registrants each. If you are new to electron microscopy, this is a low-cost way to get oriented before requesting instrument time.
• Access is tied to Texas A&M participation for the free workshop. The site states the workshop is free for Texas A&M University participants; it does not state pricing or access terms for instrument use itself, so ask the center directly about scheduling and costs.

How to choose among them

Start from your sample and your question, not the instrument name:

1. Is your signal fluorescent, and do you need optical sections? Go to the confocal/STED/FLIM system.
2. Do you need surface topography of a solid sample? Start with SEM.
3. Do you need to cut into a specific spot and image the cross-section, or work with frozen samples? The DualBeam Cryo FIB-SEM is the relevant tool.
4. Do you need internal structure at nanometer resolution from a thin sample? That is TEM territory, and it will require the most preparation.

For full specifications, accessory details, and booking information, use the instrument pages linked from the MIC homepage rather than relying on the featured list alone.

The Microscopy and Imaging Center (MIC) at microscopy.tamu.edu is Texas A&M University's core facility for microscopy and imaging, described on its site as promoting cutting-edge research in basic and applied sciences through research and development activities. It provides access to advanced instruments—confocal and STED/FLIM systems, scanning and transmission electron microscopes, and a cryo FIB-SEM—and supports students and researchers at Texas A&M and beyond, including through training such as a free SEM workshop for Texas A&M participants.

What the center does

The MIC positions itself as a research-support unit rather than a single lab. Its stated mission is to advance basic and applied science through research and development activities, and its site notes that data acquired at the MIC is used in research across campus and elsewhere, with a news feed tracking publications that cite use of the center.

For a new user, that translates into three practical functions:

• Instrument access — confocal, electron, and dual-beam microscopy systems under one facility.
• Training — workshops aimed at people new to a technique, such as the SEM workshop described below.
• Research output — a record of publications and cover art crediting MIC data, useful if you need to justify using the facility in a grant or paper.

Instruments listed on the site

The homepage names the following systems:

The site also links to a fuller "More Instruments" page, so treat this table as the featured set rather than a complete inventory. If your work depends on a specific detector, laser line, or sample environment, confirm availability with the center before planning around it.

Example: the free SEM workshop

The clearest documented way to start with the MIC is its Scanning Electron Microscopy Workshop, listed for November 3–4, 2026, with sessions from 10:00 am–4:00 pm and 1:00 pm–4:00 pm in ILSB 1143 and virtually.

• Cost: free of charge for Texas A&M University participants.
• Audience: students and researchers new to SEM.
• Content: basic principles of SEM imaging, factors affecting resolution and contrast, and basic sample preparation.
• Format: presentations accessible in person or online via Zoom; hands-on sessions limited to 5 registrants each.

If you are outside Texas A&M, note that the free eligibility is stated specifically for Texas A&M participants—check with the center about terms for other users rather than assuming the same conditions apply.

Who it serves

The site describes the MIC as serving students and researchers, with research use extending "all over campus and beyond." Two implications follow:

• New users can enter through training rather than prior microscopy experience—the SEM workshop is explicitly for beginners.
• Experienced users can point to the center's publication record when documenting facility use; the news feed collects articles citing MIC data, including cover art in Macromolecular Materials and Engineering featuring TEM work and confocal imaging used to fluorescently tag a tick kinin neuropeptide.

Practical next steps

1. Identify your technique — confocal/STED/FLIM, SEM, TEM, or FIB-SEM — using the instrument list above as a starting point.
2. Check training — if you are new to the method, look at the events page for workshops like the SEM session; hands-on seats are capped at 5, so register early.
3. Confirm access terms — the site documents free workshop participation for Texas A&M affiliates but does not publish instrument rates or scheduling policies on the homepage; ask the center directly about costs, booking, and eligibility for your situation.
4. Plan sample prep — the workshop covers basic preparation, which is often the limiting step in electron microscopy; factor it into your timeline.

The main open questions the public pages do not answer are instrument pricing, reservation procedures, and whether external (non-Texas A&M) researchers can access instruments on the same terms. Those are worth a direct inquiry before you build a project around the facility.

The Microscopy and Imaging Center (MIC) at Texas A&M University hosts a free Scanning Electron Microscopy (SEM) workshop on November 3–4, 2026, and you can attend if you are a Texas A&M student or researcher new to SEM. The workshop runs 10:00 am–4:00 pm and 1:00 pm–4:00 pm across the two days in ILSB 1143 and online via Zoom, and you register through the link on the MIC website. Hands-on sessions are capped at 5 registrants each, so early registration matters if you want the practical portion rather than only the talks.

Who the workshop is for

The MIC states the workshop is intended for students and researchers who are new to scanning electron microscopy. It is free of charge for Texas A&M University participants. If you already run SEM routinely, the presentation content (basic principles, resolution and contrast, sample prep) will likely be below your level, and the limited hands-on seats are better left to newcomers.

If you are outside Texas A&M, the page only documents free participation for Texas A&M participants; it does not state terms for other attendees, so confirm with the MIC before planning to attend.

What the workshop covers

The presentations cover three areas:

• Basic principles of SEM imaging
• Factors affecting resolution and contrast
• Basic sample preparation techniques

The format combines presentations with hands-on sessions. Presentations are accessible both in person and online via Zoom; hands-on sessions are in person and limited to 5 registrants each.

How to register and attend

1. Confirm your eligibility. You should be a Texas A&M student or researcher new to SEM.
2. Go to the MIC website (microscopy.tamu.edu) and find the workshop listing under the news/events area on the homepage.
3. Use the "Register Here" link in that listing to sign up. Register early if you want a hands-on seat, since each session holds only 5 people.
4. Choose your mode. Attend in person at ILSB 1143 for the full experience including hands-on work, or join the presentations via Zoom if you only need the talks.
5. Check the schedule. Sessions run 10:00 am–4:00 pm and 1:00 pm–4:00 pm on November 3–4, 2026; confirm which block your session falls in when you register.

Verification: After registering, you should receive confirmation from the MIC. If you registered for a hands-on session, confirm your seat is held, since capacity is 5 per session.

Common pitfalls

• Waiting too long to register. The 5-person hands-on cap fills quickly; the presentation portion via Zoom has no stated cap, so you can still attend the talks if hands-on seats are gone.
• Assuming the workshop replaces instrument training. The page describes it as an introduction for newcomers; access to specific instruments like the Leica SP8 confocal, FEI Quanta 600 FE-SEM, TFS Helios 5 CX DualBeam CRYO FIB-SEM, or JEOL 1200 EX TEM is a separate matter you should raise with MIC staff.
• Showing up without confirming the room. The location is listed as ILSB 1143, but verify the room and time in your registration confirmation in case of changes.

Why the MIC is worth knowing beyond the workshop

The MIC describes its mission as promoting cutting-edge research in basic and applied sciences through research and development activities, and its instruments support work across campus and beyond—data acquired at the MIC appears in publications such as Macromolecular Materials and Engineering cover art featuring TEM work. If the workshop leaves you wanting instrument access, the center's instrument list and cited-research page are the natural next stops on the site.